The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Jun. 23, 2015
Aspect Ai Ltd., Shoham, IL;
Peter Bendel, Rishon LeZion, IL;
ASPECT AI LTD., Shoham, IL;
Abstract
A method of incorporating the influence of diffusion into the CPMG-based T2 measurement for one or more of the following: water cut measurement; performing inline measurements of flow rate; density; and rheology of a flowing fluid. The method includes conducting a 'standard T1/T2 experiment' at least twice by providing one scan without a field gradient during the CMPG echo train. Then, providing a second scan with the application of a gradient, where in the second experiment the measured T2 (T2) is affected solely by water diffusion, thus shifting cross peaks which represent water on the first T1/T2 spectrum to lower T2 values on the second spectrum.