The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Jun. 01, 2018
Hefei Boe Optoelectronics Technology Co., Ltd., Anhui, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Hongqiao Xu, Beijing, CN;
Qiang Huang, Beijing, CN;
Shufeng Wang, Beijing, CN;
Jinbo Xu, Beijing, CN;
HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Anhui, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
An optical measurement device and an optical measurement method are provided. The optical measurement device includes a test backplane, a light emitter, a center point detector and a movement device. The movement device is provided on the test backplane, and configured to carry a to-be-tested sample. The light emitter is configured to display a first center point on the to-be-tested sample, and the first center point corresponds to a center point of the test backplane. The center point detector is configured to detect a second center point and display the second center point on the to-be-tested sample, and the second center point is a center point of the to-be-tested sample. The movement device is further configured to move the to-be-tested sample, such that the first center point and the second center point coincide with each other.