The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Mar. 05, 2020
Applicant:

Gaston Daniel Baudat, Glenmoore, PA (US);

Inventor:

Gaston Daniel Baudat, Glenmoore, PA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/00 (2006.01); G01J 1/42 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4257 (2013.01); G06T 1/0014 (2013.01); G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20216 (2013.01);
Abstract

A method of wavefront sensing with engineered images is provided with at least one wave receiving system. At least one desired parameter range is designated for the wave receiving system. At least one preliminary engineered image is then simulated to correspond with the desired parameter range. At least one inverse-model is then generated that outputs the desired parameter range by inputting the preliminary engineered image. A training process is then executed for the inverse-model to readily and accurately output the desired parameter range by inputting the preliminary engineered image. At least one measurement engineered image is then received in order to output at least one estimated parameter value for the wave receiving system with the inverse-model by inputting the measurement engineered image into the inverse-model.


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