The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Mar. 15, 2018
Applicant:

Molecular Imprints, Inc., Austin, TX (US);

Inventors:

Chieh Chang, Cedar Park, TX (US);

Christophe Peroz, San Francisco, CA (US);

Roy Matthew Patterson, Hutto, TX (US);

Matthew S. Shafran, Fletcher, NC (US);

Christopher John Fleckenstein, Round Rock, TX (US);

Charles Scott Carden, Austin, TX (US);

Assignee:

Molecular Imprints, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 43/58 (2006.01); B29C 35/08 (2006.01); G02B 1/04 (2006.01); B29C 33/10 (2006.01); B29C 43/54 (2006.01); G03F 7/00 (2006.01); B29L 11/00 (2006.01); B29C 37/00 (2006.01); B29C 43/56 (2006.01);
U.S. Cl.
CPC ...
B29C 43/58 (2013.01); B29C 33/10 (2013.01); B29C 35/0805 (2013.01); B29C 43/54 (2013.01); G02B 1/04 (2013.01); G03F 7/0002 (2013.01); B29C 35/0888 (2013.01); B29C 2035/0827 (2013.01); B29C 2035/0833 (2013.01); B29C 2037/90 (2013.01); B29C 2043/561 (2013.01); B29C 2043/5833 (2013.01); B29C 2043/5841 (2013.01); B29L 2011/00 (2013.01);
Abstract

An example system is configured to photocure a photocurable material to form a polymer film. The system includes a first chuck configured to support a first substantially planar mold, a second chuck configured to support a second substantially planar mold, and an actuable stage coupled to the first chuck and/or the second chuck. The actuable stage is configured to position the first chuck and/or the second chuck so that the first and second molds are separated by a gap. The system also includes a sensor arrangement for obtaining measurement information indicative of a distance between the first and second molds and/or a pressure between the first and second chucks at each of at least three locations. The system also includes a control module configured control the gap between the first and second molds based on the measurement information.


Find Patent Forward Citations

Loading…