The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Feb. 22, 2020
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Marco Erler, Oberkochen, DE;
Daniel Weiss, Essingen-Forst, DE;
Martin Krenkel, Aalen, DE;
Wolfgang Kimmig, Aalen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
An x-ray examination arrangement includes an x-ray radiation source arranged at a source position, at least two x-ray detectors having active detector areas and being arranged such that the active detector areas capture different solid angle ranges with respect to x-ray radiation produced by the x-ray radiation source and emanating from the source position, and a control device configured to calculate a projection onto a virtual detector plane based on radiographs respectively captured by the at least two x-ray detectors and spatial poses of the at least two x-ray detectors relative to the source position, and provide a combined radiograph for the virtual detector plane based on the projection. In addition, a method for operating the x-ray examination arrangement and a computed tomography device are provided.