The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2022
Filed:
Dec. 18, 2019
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Ryoichi Hirose, Itabashi-ku, JP;
Tatsuo Yamaguchi, Warabi, JP;
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/15 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/103 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/103 (2013.01); A61B 3/1025 (2013.01); A61B 3/12 (2013.01);
Abstract
An ophthalmologic apparatus includes an acquisition unit and a controller. The acquisition unit includes an optical scanner capable of deflecting light in a predetermined deflection angle range. The acquisition unit is configured to acquire data of a subject's eye by performing A-scan on the subject's eye using optical coherence tomography by measurement light deflected by the optical scanner. The controller is configured to cause the acquisition unit to perform A-scan based on a deflection operation state of the optical scanner.