The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Jan. 30, 2020
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Jianwu Xu, Titusville, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Bin Nie, Williamsburg, VA (US);
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/08 (2006.01); H04L 67/12 (2022.01); G16Y 40/20 (2020.01); G06N 5/02 (2006.01); G16Y 20/20 (2020.01); G16Y 40/35 (2020.01);
U.S. Cl.
CPC ...
H04L 67/12 (2013.01); G06N 5/022 (2013.01); G16Y 20/20 (2020.01); G16Y 40/20 (2020.01); G16Y 40/35 (2020.01);
Abstract
Systems and methods for evaluating another computer system using temporal discrete event analytics are provided. The method includes generating sentences of discrete event sequences for multiple sensors. The method also includes building a sensor relationship network in response to generating the sentences of discrete event sequences. The sensor relationship network is analyzed to determine relationships between the multiple sensors. The method further includes performing fault diagnosis based on the sensor relationship network and the relationships between the multiple sensors.