The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Feb. 28, 2019
Applicant:

Jiangsu University, Zhenjiang, CN;

Inventors:

Hao Zhu, Zhenjiang, CN;

Zhi Zhang, Zhenjiang, CN;

Senshan Mao, Zhenjiang, CN;

Shuaijie Zhu, Zhenjiang, CN;

Zhaoyang Zhang, Zhenjiang, CN;

Kun Xu, Zhenjiang, CN;

Anbin Wang, Zhenjiang, CN;

Douyan Zhao, Zhenjiang, CN;

Assignee:

JIANGSU UNIVERSITY, Zhenjiang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/268 (2006.01); C23C 18/12 (2006.01); C23C 14/08 (2006.01);
U.S. Cl.
CPC ...
H01L 21/268 (2013.01); C23C 14/08 (2013.01); C23C 18/12 (2013.01);
Abstract

An apparatus for micromachining a semiconductor material from opposing sides through synchronous coordination of laser and electrochemistry includes an optical path system, a stable low-pressure jet generation system, and an electrolytic machining system. The optical path system includes a laser generator, a beam expander, a reflector, a galvanometer, and a lens. The electrolytic machining system includes a direct-current pulsed power supply, an adjustable cathode fixture, an electrolyte tank, a current probe, and an oscilloscope. The stable low-pressure jet generation system provides an electrolyte flow into a metal needle. The electrolyte flow forms an electrolyte layer between a semiconductor material and a cathode copper plate, such that the cathode and the anode are in electrical contact with each other. In a method employing the apparatus, a laser beam is irradiated onto the semiconductor material to form a local high-temperature region, which leads to a localized increase in electrical conductivity.


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