The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Oct. 04, 2021
Applicant:
Tamr, Inc., Cambridge, MA (US);
Inventors:
George Anwar Dany Beskales, Waltham, MA (US);
Alexandra V. Batchelor, Cambridge, MA (US);
Brian A. Long, Somerville, MA (US);
Assignee:
TAMR, INC., Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/28 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/2365 (2019.01);
Abstract
A method is provided for producing a record clustering with estimated accuracy metrics with confidence intervals. These metrics can be used to determine whether a clustering should be accepted as the output of the system, and whether model training is necessary to meet desired clustering accuracy. A collection of test records is used in the process, wherein each test record is a member of a collection of input records.