The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Mar. 23, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrew C. M. Hicks, Wappingers Falls, NY (US);

Diane Marie Stamboni, Poughkeepsie, NY (US);

Joshua David Steen, Fishkill, NY (US);

Gregg Arquero, White Plains, NY (US);

Thomas William Conti, Poughkeepsie, NY (US);

Michael Page Kasper, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/079 (2013.01); G06F 11/3688 (2013.01);
Abstract

Aspects of the invention include executing a first test case on a system, capturing a first state of the system during execution of the first test case, determining a first result of the first test case, performing a second execution of the first test case on the system in response to the first result of the first test case being an unexpected result, capturing a second state of the system during the second execution of the first test case, determining a second result of the first test case, analyzing the first state and the second state to determine a state similarity score, and categorizing the first result as a false positive based at least in part on the state similarity score being above a first threshold and a determination that the second result is a different result than the first result.


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