The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Aug. 07, 2017
International Business Machines Corporation, Armonk, NY (US);
Francisco M. Anaya, Hollister, CA (US);
Tom C. L. Chen, Markham, CA;
Michael S. Fulton, Brackendale, CA;
Trong Truong, Markham, CA;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A test suite is executed to test a computer program for a plurality of variables. A variable value is generated for each variable of the plurality of variables at a predetermined location of the computer program. Whether a test included in the test suite is successful is determined. If the test is successful, the variable value is recorded as part of a success value set. If the test is not successful, the variable value is recorded as part of a failure value set. A confidence metric is calculated for the variable value. A relevance metric for each variable of the plurality of variables is measured, based on a Jaccard distance between the success value set and the failure value set. The failure value set, the success value set, the confidence metric for the variable value, and the relevance metric for each variable of the plurality of variables are presented.