The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Nov. 27, 2018
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Jianwu Xu, Titusville, NJ (US);
Hui Zhang, Princeton Junction, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Tanay Kumar Saha, Indianapolis, IN (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 20/10 (2019.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0778 (2013.01); G06F 11/0787 (2013.01); G06F 11/0793 (2013.01); G06N 20/10 (2019.01);
Abstract
Systems and methods for contextual event sequence analysis of system failure that analyzes heterogeneous system event record logs are disclosed. The disclosure relates to analyzing event sequences for system failure in ICT and other computerized systems and determining their causes and propagation chains.