The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Mar. 28, 2018
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Karl A. Deisseroth, Stanford, CA (US);
Sean Quirin, Palo Alto, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
The present disclosure provides optical image acquisition methods and devices for microscopy systems that enhance the field-of-view during image acquisition. According to aspects of the present disclosure, the methods and devices for enhancing the field-of-view of a sample during image acquisition in an optical imaging system include directing an incident electromagnetic field through a plurality of polarization-selective gratings, where each of the polarization-selective gratings is configured to apply a discrete amount of angular displacement to the incident electromagnetic field in a direction transverse or axial to the optical system's electromagnetic axis, resulting in an enhanced field-of-view during image acquisition.