The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Oct. 18, 2018
Applicant:
Max-delbrück-centrum Für Molekulare Medizin IN Der Helmholtz-gemeinschaft, Berlin, DE;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 7/28 (2021.01); G02B 21/36 (2006.01); G02F 1/29 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01); G02B 7/287 (2013.01); G02B 21/361 (2013.01); G02F 1/29 (2013.01); G02F 1/294 (2021.01);
Abstract
A microscope-autofocus device for feedback-controlling a focal position of an imaging system of a microscope apparatus, wherein the imaging system includes a microscope objective, a monitoring beam source for creating a monitoring beam, a detector device for detecting a drift variation of an axial objective distance between the microscope objective and a sample by sensing the monitoring beam directed through the imaging system to the sample and reflected by the sample, and a feedback loop device for controlling the imaging system in dependency on the detected objective distance variation of the microscope objective.