The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Aug. 20, 2020
Applicants:

Tsinghua University, Beijing, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Jun Zhu, Beijing, CN;

Ben-qi Zhang, Beijing, CN;

Guo-Fan Jin, Beijing, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); G02B 5/08 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0005 (2013.01); G02B 5/08 (2013.01); G02B 27/0025 (2013.01);
Abstract

A method for designing freeform surface imaging system comprises: constructing a series of coaxial spherical systems with different optical power (OP) distributions; tilting all optical elements of each coaxial spherical system by a series of angles to obtain a series of off-axis spherical systems; finding all unobscured off-axis spherical systems; and then specifying a system size or structural constraints, and finding a series of compact unobstructed off-axis spherical systems; constructing a series of freeform surface imaging systems based on the series of compact unobstructed off-axis spherical system, and correcting the OP of entire system; improving an image quality of each freeform surface imaging systems and finding an optimal tilt angle of an image surface; and automatically evaluating an image quality of each freeform surface imaging system based on an evaluation metric, and outputting the freeform surface imaging systems that meet a given requirements.


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