The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

May. 15, 2020
Applicant:

Lawrence Livermore National Security, Llc, Livermore, CA (US);

Inventors:

Eyal Feigenbaum, Livermore, CA (US);

Nathan James Ray, Tracy, CA (US);

Jae Hyuck Yoo, Dublin, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/12 (2006.01); G02B 1/00 (2006.01); G02B 1/11 (2015.01);
U.S. Cl.
CPC ...
G02B 1/12 (2013.01); G02B 1/002 (2013.01); G02B 1/11 (2013.01);
Abstract

A method and system is disclosed for creating an optical component having a spatially controlled refractive index and uniform anti-reflective layer. The method may involve alternately depositing and dewetting two or more thin metal material layers on the substrate to form a mask having a spatially varying nano-particle distribution, and with an increased thickness beyond what could be achieved using a single, thick layer of the same material. The substrate may then be etched, using the mask, to imprint a spatially patterned nanostructure pattern on a surface the substrate in accordance with the mask.


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