The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Nov. 23, 2020
Applicant:

Hellma Materials Gmbh, Jena, DE;

Inventor:

Sibylle Petrak, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/167 (2006.01); G01T 1/164 (2006.01); A61B 6/03 (2006.01); G01T 1/29 (2006.01); G06T 11/00 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/167 (2013.01); A61B 6/037 (2013.01); G01T 1/1642 (2013.01); G01T 1/1644 (2013.01); G01T 1/2985 (2013.01); G06T 11/006 (2013.01); G01T 7/00 (2013.01); G06T 2211/421 (2013.01);
Abstract

A method for multidimensional direction measurement of gamma radiation in the far field by means of a group of several energy discriminating detectors synchronized with each other for detection of radiation can use unidirectional and bidirectional Compton scattering processes and lookup tables LUT, a defined functional value f(E,E), a list of defined detector pairs with an identification number i for defined detector pairs, and one or more frequency distributionsfor the acquisition of the measurement values. In some embodiments, the method can include setting up a detector system, acquiring measurement values, associating coincidence events with an Identification number, calculating a functional value, acquiring coincidence events in frequency distributions, and calculating one or more direction distributions from the frequency distributions.


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