The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Oct. 31, 2018
Spirent Communications, Plc;
Neil Christopher Pearse, Ashburton, GB;
Mark Geoffrey Holbrow, Paignton, GB;
Spirent Communications, PLC, Crawley, GB;
Abstract
A method is provided for calibrating a test platform including a plurality of system outputs to align RF signals generated by the system outputs. RF power of a combined RF signal is detected, where the combined RF signal is from a reference RF signal generated by a reference system output in the plurality of system outputs and a test RF signal generated by a test system output in the plurality of systems outputs. A phase of the test RF signal is iteratively shifted relative to the reference RF signal until the detected RF power reaches a minimum. The test RF signal is inverted to be in-phase with the reference RF signal when the combined RF power reaches the minimum. A system is also provided for calibrating a test platform including a plurality of system outputs to align RF signals generated by the system outputs.