The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Jan. 21, 2020
Applicant:

Aisin Seiki Kabushiki Kaisha, Kariya, JP;

Inventors:

Nobuyasu Miwa, Kariya, JP;

Kosuke Tsukao, Kariya, JP;

Kaoru Nakagaki, Kariya, JP;

Tsubasa Kamiya, Kariya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 15/931 (2020.01); G01S 15/87 (2006.01); G01S 7/54 (2006.01); G01S 15/08 (2006.01);
U.S. Cl.
CPC ...
G01S 15/931 (2013.01); G01S 7/54 (2013.01); G01S 15/08 (2013.01); G01S 15/876 (2013.01);
Abstract

An object detection device includes: first and second transmission/reception units spaced apart from each other and configured to transmit an exploration wave and receive the exploration wave reflected by an object; and a processing unit configured to calculate a position of the object based on reception results by the first and second transmission/reception units. The processing unit includes: a distance processing unit configured to calculate first and second points based on the reception results, and calculates a separation distance between the first and second points; a position calculation unit configured to calculate the position based on the first and second points; a reflection intensity processing unit configured to calculate a reflection intensity indicating an intensity of the exploration wave received by the first and second transmission/reception units; and a position correction unit configured to correct the position based on the separation distance and the reflection intensity.


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