The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Mar. 07, 2019
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventor:
Philip Diegmann, Munich, DE;
Assignee:
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/319 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318519 (2013.01); G01R 13/0236 (2013.01); G01R 31/319 (2013.01); G01R 31/31905 (2013.01); G01R 31/31908 (2013.01); G01R 31/31912 (2013.01); G01R 31/318583 (2013.01);
Abstract
The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.