The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Jan. 17, 2020
Applicant:
Tecat Technologies (Suzhou) Limited, Suzhou Industrial Park Suzhou, CN;
Inventor:
Choon Leong Lou, Singapore, SG;
Assignee:
TECAT TECHNOLOGIES (SUZHOU) LIMITED, Suzhou Industrial Park Suzhou, CN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2887 (2013.01);
Abstract
A probing device includes a chuck configured to support a device under test (DUT); and a manipulator or probe card disposed above the chuck and including a plurality of probes protruding from the manipulator towards the chuck, wherein the chuck includes a roughened surface and vacuum suction holes for placement of wafer.
Lou, Choon. (2022). Probing device (U.S. Patent No. 11293975). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11293975
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile