The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Dec. 09, 2016
Applicants:

Peking University First Hospital, Beijing, CN;

Zhongling Liu, Shanghai, CN;

Inventors:

Zhongling Liu, Shanghai, CN;

Minghui Zhao, Beijing, CN;

Feng Yu, Beijing, CN;

Assignees:

PEKING UNIVERSITY FIRST HOSPITAL, Shanghai, CN;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 33/68 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5308 (2013.01); G01N 33/68 (2013.01); G01N 33/543 (2013.01);
Abstract

A method comprises adding reagent I to a sample to be detected, incubating to obtain a first detection sample, and detecting to obtain a first absorbance value A1 of the sample to be detected; adding reagent II to the first detection sample, incubating to obtain a second detection sample, and detecting to obtain a second absorbance value A2 of the sample to be detected; adding reagent I to a standard sample, incubating to obtain a first detection standard, and detecting to obtain a first absorbance value B1 of the standard; adding reagent II to the first detection standard, incubating to obtain a second detection standard, and detecting to obtain a second absorbance value B2 of the standard; and using A1 and A2, and B1 and B2 to obtain a concentration level of complement factor H in the sample to be detected.


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