The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Mar. 14, 2018
Applicant:

Ihi Inspection and Instrumentation Co., Ltd., Tokyo, JP;

Inventors:

Shintaro Fukumoto, Yokohama, JP;

Hiraku Kawasaki, Yokohama, JP;

Takahiro Arakawa, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2487 (2013.01); G01N 29/262 (2013.01); G01N 2291/106 (2013.01);
Abstract

A plurality of ultrasonic transducers of the invented probe are separated in a concentric circle pattern, separated in rows that are orthogonal to a reference line L that passes through the center of circles, and positioned line symmetrically with respect to the reference line L. The detection surface of the invented probe has a circular shape having the diameter D, and has a plurality of segments divided into a plurality of arc-shaped portions that are symmetrical with respect to the reference line L. Further a controller which has a plurality of control channels for controlling pairs of the line symmetrical ultrasonic transducers under the same conditions is provided.


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