The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Feb. 15, 2019
Applicant:

Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;

Inventors:

Michael Ingelmann, Vaihingen an der Enz, DE;

Ralf Steuerwald, Eberdingen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/78 (2006.01); G01N 33/18 (2006.01); G01N 35/10 (2006.01); G01N 21/3577 (2014.01);
U.S. Cl.
CPC ...
G01N 21/78 (2013.01); G01N 21/3577 (2013.01); G01N 33/182 (2013.01); G01N 35/1095 (2013.01);
Abstract

The present disclosure includes to an analysis device for determining a measurand representing a silicate concentration in a sample liquid, including a housing divided into an electronics region and a fluidic region, wherein the electronics region is separated from the fluidic region by at least one wall. In the fluidic region are a measuring cell, a sample feed line connected to the measuring cell, at least one liquid container having a liquid therein and connected to the measuring cell via a liquid line, and at least one pump configured to transport at least a portion of the liquid from the liquid container into the measuring cell, in which the sample feed line is connected to an over-pressurized container containing the sample liquid, where the container is arranged outside the housing. The electronics region includes an electronic control system configured to control the operation of the analysis device.


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