The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Nov. 12, 2019
Applicant:
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Inventor:
Shun Sato, Nagoya, JP;
Assignee:
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01M 13/00 (2019.01);
U.S. Cl.
CPC ...
G01M 13/00 (2013.01);
Abstract
An equipment inspection system capable of creating an inspection plan for inspecting a component part of an equipment at an appropriate timing is provided. An equipment inspection system includes an index acquisition unit, an importance level judgement unit, and an inspection time determination unit. The index acquisition unit acquires at least one influence index. The importance level judgement unit judges an importance level of an inspection on a component part based on the influence index. The inspection time determination unit determines the inspection time of the component part according to the importance level.