The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Dec. 21, 2017
Applicant:

ID Quantique SA, Carouge, CH;

Inventors:

Felix Bussieres, Vessy, CH;

Bruno Sanguinetti, Geneva, CH;

Assignee:

ID QUANTIQUE SA, Carouge, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3145 (2013.01);
Abstract

The present invention relates to a measuring device () for measuring reflection in an optical fiber (), the device comprising: emitting means () connected to the optical fiber () and configured to emit light into the optical fiber (), measuring means () connected to the optical fiber () and configured to receive a reflected light from the optical fiber (), wherein the measuring means comprises a first photon detector () and a second photon detector (), wherein the operation of the second photon detector () and/or the reflected light reaching the second photon detector () is controlled based on an output of the first photon detector ().


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