The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Feb. 25, 2020
Faro Technologies, Inc., Lake Mary, FL (US);
Daniel Döring, Ditzingen, DE;
Gerrit Hillebrand, Waiblingen, DE;
Rasmus Debitsch, Fellbach, DE;
Rene Pfeiffer, Muehlacker, DE;
Martin Ossig, Tamm, DE;
Alexander Kramer, Kornwestheim, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A three-dimensional (3D) measurement system, a method of measuring 3D coordinates, and a method of generating dense 3D data is provided. The method of measuring 3D coordinates includes using a first 3D measurement device and a second 3D measurement device in a cooperative manner is provided. The method includes acquiring a first set of 3D coordinates with the first 3D measurement device. The first set of 3D coordinates are transferred to the second 3D measurement device. A second set of 3D coordinates is acquired with the second 3D measurement device. The second set of 3D coordinates are registered to the first set of 3D coordinates in real-time while the second 3D measurement device is acquiring the second set of 3D coordinates.