The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Dec. 16, 2019
Applicant:

Ametek, Inc., Berwyn, PA (US);

Inventors:

Alex Mak, Canton, MA (US);

Arief Raja, Bangalore, IN;

Charles Falzarano, Lakeville, MA (US);

Shali Avidzba, Sudbury, MA (US);

Kerri Topham, Attleboro, MA (US);

Assignee:

AMETEK, INC., Berwyn, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
G01B 5/28 (2013.01);
Abstract

A texture analyzer having a support structure including a base plate, a carriage support, and a moveable carriage that receives a load cell module; a fixture to receive a sample between the base plate and the load cell module; a memory storing support structure and load cell module deflection parameters; and a processor. The processor is configured to identify the load cell module, retrieve the support structure deflection parameters and one of multiple load cell module deflection parameters, obtain raw measurement signals from the load cell module, and refine the raw measurement signals to compensate for deflection in the load cell module using the retrieved load cell module deflection parameters and support structure deflection parameters.


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