The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Feb. 13, 2018
Applicant:

Oerlikon Surface Solutions Ag, Pfäffikon, Pfäffikon, CH;

Inventors:

Siva Phani Kumar Yalamanchili, Sargans, CH;

Mirjam Arndt, Bad Ragaz, CH;

Juergen Ramm, Muhlebundtestrasse, CH;

Siegfried Krassnitzer, Walenstadt, AT;

Denis Kurapov, Walenstadt, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/06 (2006.01); C23C 14/02 (2006.01); C23C 14/34 (2006.01); C23C 30/00 (2006.01); C23C 14/35 (2006.01);
U.S. Cl.
CPC ...
C23C 14/0641 (2013.01); C23C 14/024 (2013.01); C23C 14/3485 (2013.01); C23C 30/005 (2013.01); C23C 14/35 (2013.01);
Abstract

The present invention relates to a component comprising a substrate coated with a coating having a film (or) comprising one or more transition metals, TM, aluminium, Al, and nitrogen, N, wherein the TM and N as well as Al and N are comprised in the film forming respectively nitride compounds, wherein the transition metal nitride, TM-N, is present in the film distributed in different portions exhibiting one crystalline phase of TM-N, and the aluminium nitride, Al—N, is present in the film in different portions exhibiting one phase of Al—N, whereas the phase of the transition metal nitride is cubic, c-TMN, the phase of the aluminium nitride is wurtzite, w-AIN, and wherein the film exhibits coherent or (semi-) coherent interfaces between the c-TMN phase portions and the w-AI-N phase portions.


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