The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Mar. 27, 2018
Applicants:

Shimadzu Corporation, Kyoto, JP;

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Taketo Kishi, Kyoto, JP;

Makoto Sato, Kyoto, JP;

Toshiyuki Takatsuji, Ibaraki, JP;

Makoto Abe, Ibaraki, JP;

Hiroyuki Fujimoto, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/08 (2006.01); A61B 6/00 (2006.01); A61B 90/00 (2016.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/583 (2013.01); A61B 6/032 (2013.01); A61B 90/06 (2016.02); A61B 2090/061 (2016.02);
Abstract

In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arranged in an XYZ space on the base. On a flat surface on the top of the base, the support rods supporting the spheres and having different lengths are arranged at predetermined intervals. In doing so, the spheres are arranged in the XYZ space respectively at appropriate inter-sphere distances.


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