The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
May. 10, 2018
University of Maryland, Baltimore, Baltimore, MD (US);
Fu-Ming Hu, Ellicott City, MD (US);
Lynn G. Stansbury, Seattle, WA (US);
Colin F. Mackenzie, Pasadena, MD (US);
Thomas M. Scalea, Baltimore, MD (US);
Deborah M. Stein, Owings Mills, MD (US);
Shiming Yang, Halethorpe, MD (US);
University Of Maryland, Baltimore, Baltimore, MD (US);
Abstract
A method and apparatus for monitoring collection of subject condition data is provided. The method includes receiving a value of a parameter of subject condition data and a value of a sample time, for each of a plurality of sample times. The method also includes storing the subject condition data in a data structure including a first field for holding data indicating a current sample time and a second field for holding data indicating the value of the parameter. The method also includes determining a time gap defined by a duration between the current sample time and a most recent sample time and determining whether the time gap exceeds a time gap threshold and causing an apparatus to perform remedial action. A method for presenting the subject condition data on a display is also provided.