The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

May. 17, 2018
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Chuting Yao, Beijing, CN;

Delai Zheng, Shanghai, CN;

Jian Wang, Beijing, CN;

Haibo Xu, Beijing, CN;

Yiru Kuang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 36/00 (2009.01); H04L 1/00 (2006.01); H04W 72/04 (2009.01); H04W 72/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04L 1/0026 (2013.01); H04W 36/0058 (2018.08); H04W 72/0446 (2013.01); H04W 72/085 (2013.01);
Abstract

A measurement method includes sending, by a first device to a second device, a message including a first configuration, wherein the first configuration indicates that a first event triggers the second device to send a first measurement message. The first event includes at least a channel quality of a measurement object is less than a first threshold, the channel quality of the measurement object is lower than a channel quality of a serving cell of the second device, the channel quality of the measurement object is less than the first threshold, and the channel quality of the serving cell of the second device is greater than a second threshold, or the channel quality of the measurement object is lower than the channel quality of the serving cell of the second device and the channel quality of the serving cell of the second device is greater than the second threshold.


Find Patent Forward Citations

Yao, Chuting. (2022). Measurement method and device (U.S. Patent No. 11290905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11290905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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