The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Jun. 18, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Ranga Ramanujam Srinivasan, Karnataka, IN;

Mahant Siddaramanna, Karnataka, IN;

Naveen Srinivasamurthy, Karnataka, IN;

Assignee:
Attorneys:
Int. Cl.
CPC ...
H04N 19/176 (2014.01); H04N 19/147 (2014.01); H04N 19/11 (2014.01);
U.S. Cl.
CPC ...
H04N 19/176 (2014.11); H04N 19/11 (2014.11); H04N 19/147 (2014.11);
Abstract

A method for intra-prediction estimation is provided that includes determining a best intra-prediction mode for a block of samples, wherein at least some of the neighboring samples used for intra-prediction estimation include approximate reconstructed samples, applying approximate reconstruction to the block of samples using the best intra-prediction mode to generate a block of approximate reconstructed samples, and storing the block of approximate reconstructed samples for use in intra-prediction estimation of other blocks of samples.


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