The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Jul. 31, 2014
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Jinman Kang, San Diego, CA (US);

Ben Wynne, San Diego, CA (US);

David Bradley Short, San Diego, CA (US);

Christopher S Tanner, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/25 (2018.01); H04N 13/246 (2018.01); G01B 11/00 (2006.01); G01B 11/24 (2006.01); G06T 7/80 (2017.01); G06T 7/55 (2017.01); G06T 7/593 (2017.01); H04N 13/207 (2018.01); H04N 13/271 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/25 (2018.05); G01B 11/002 (2013.01); G01B 11/24 (2013.01); G06T 7/55 (2017.01); G06T 7/593 (2017.01); G06T 7/80 (2017.01); H04N 13/246 (2018.05); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); H04N 13/207 (2018.05); H04N 13/271 (2018.05); H04N 2013/0081 (2013.01); H04N 2213/003 (2013.01);
Abstract

A method and corresponding system for reconstructing the surface geometry of a three-dimensional object is disclosed. The system comprises a cluster of heterogeneous sensors, including a two-dimensional high-resolution camera and a three-dimensional depth camera, and a turntable operable to rotate incrementally. In operation, the turntable is rotated to first and second positions and two-dimensional and three-dimensional data sets are obtained using the two-dimensional high-resolution camera and the three-dimensional depth camera. Corresponding features from the two-dimensional data sets are identified and used to identify the same corresponding features in the three-dimensional data sets. The three-dimensional corresponding features are used to calculate a three-dimensional homography, which is used to align the three-dimensional data sets. Following alignment, a three-dimensional mesh is generated from the aligned data sets.


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