The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Dec. 15, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yosuke Naruse, Saitama, JP;

Yasunobu Kishine, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/232 (2006.01); G02B 5/18 (2006.01); G02B 27/42 (2006.01); G02B 3/08 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); G02B 5/1876 (2013.01); G02B 27/4205 (2013.01); G02B 3/08 (2013.01);
Abstract

Provided an imaging system, an imaging apparatus and an image processing apparatus constituting the imaging system, an image processing method used in the image processing apparatus, and a non-transitory recording medium for causing a computer to implement the image processing method. According to the imaging apparatus according to one aspect of the present invention, an image of high image quality can be acquired (reconstructed) in the imaging system configured to include the imaging apparatus by acquiring first and second projected images using Fresnel zone plates having different phases of local spatial frequencies. In addition, the design parameters (pitches and the areas of the Fresnel zone plates, the number of pixels of image sensors, a distance between the Fresnel zone plates and the image sensors, and the like) can be selected without considering an effect of a noise component, and the number of restrictions on the design parameters is small.


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