The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Sep. 21, 2020
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G02B 7/34 (2021.01); G02B 7/36 (2021.01); G03B 13/36 (2021.01); G03B 17/14 (2021.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G02B 7/34 (2013.01); G02B 7/36 (2013.01); G03B 13/36 (2013.01); G03B 17/14 (2013.01);
Abstract
Provided are an imaging apparatus, an imaging method, and a program that can directly determine a sensor position at which an image with good image quality is obtained from obtained image information. The imaging apparatus moves an image sensor to a plurality of sensor positions in the optical axis direction of an imaging lens, and focuses a subject at each of the plurality of sensor positions. Image data of the subject focused at each of the plurality of sensor positions is acquired, and the image data is analyzed to calculate an image evaluation value at each of the plurality of sensor positions.