The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Jun. 18, 2020
Applicant:

The Government of the United States, As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Meredith N. Hutchinson, Washington, DC (US);

Jonathan M. Nichols, Crofton, MD (US);

Gustavo K. Rohde, Crozet, VA (US);

Nicole Menkart, Potomac, MD (US);

Geoffrey A. Cranch, Fairfax Station, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04L 1/06 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0681 (2013.01); H04L 1/0631 (2013.01);
Abstract

Methods, apparatuses, and systems for calculating time delays by a Wasserstein approach are provided. A plurality of signals are recorded by a plurality of sensors (three or more), respectively, and received at a controller. The plurality of signals recorded by the plurality of sensors are generated in response to a signal emitted by a source. The plurality of signals are converted into a plurality of probability density functions. A cumulative distribution transform for each of the plurality of probability density functions is calculated. A time delay for each unique pair of the plurality of sensors is calculated by minimizing a Wasserstein distance between two cumulative distribution transforms corresponding to the unique pair of the plurality of sensors.


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