The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Apr. 13, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sudipto Chakraborty, Plano, TX (US);

Bodhisatwa Sadhu, Peekskill, NY (US);

Wooram Lee, Briarcliff Manor, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/13 (2014.01); H03K 5/01 (2006.01); H01Q 3/34 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/01 (2013.01); H01Q 3/34 (2013.01); H03K 2005/00019 (2013.01);
Abstract

A phased array system includes tunable delay elements having active delay element(s) and passive delay element(s). A second resolution by the passive delay element is smaller than a first resolution by the active delay element, and the resolution corresponds to delay applied to an input signal and has discrete steps for phase over which the delay element can be operated. For multiple sets of tunable delay elements, a calibration process sets, for one set of the delay elements, all but an n-th active delay element and the passive delay element to a first phase, and the n-th active delay element to a second phase. In a second set of the delay elements, all of the active delay elements are set to the first phase and the passive delay element is set to the second phase. A phase difference is detected and adjusted to meet a criterion between the two sets.


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