The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Mar. 25, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Xinfeng Zhou, Shanghai, CN;

Ran Qiu, Shanghai, CN;

Wenjian Sun, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/42 (2006.01); H01J 49/40 (2006.01); G01N 30/72 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G01N 30/7233 (2013.01); H01J 49/004 (2013.01); H01J 49/0031 (2013.01); H01J 49/0045 (2013.01); H01J 49/40 (2013.01); H01J 49/42 (2013.01); G01N 2030/027 (2013.01);
Abstract

The invention provides a mass spectrometry analysis method and a mass spectrometry system. During implementation of the mass spectrometry analysis method, intensity data of the daughter ions, a first parameter of the daughter ions associated with the first physicochemical property, and a second parameter of the daughter ions associated with the second physicochemical property are all recorded to form a spectrogram data set. In a deconvolution step, the spectrogram data set is deconvoluted to categorize the daughter ions from the same parent ion according to two-dimensional features including the first parameter and the second parameter. In the above manner, the mass spectrometry analysis method and the mass spectrometry system provided by the invention can detect ions that partially overlap spectral peaks of other ions significantly, thereby improving the qualitative and quantitative ability of data analysis for data independent acquisition.


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