The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Sep. 06, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Shota Umeda, Tokyo, JP;

Keita Nogi, Tokyo, JP;

Akira Kagoshima, Tokyo, JP;

Daisuke Shiraishi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/67 (2006.01); G01J 3/443 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32926 (2013.01); G01J 3/443 (2013.01); G05B 19/41875 (2013.01); H01J 37/32972 (2013.01); H01L 21/67253 (2013.01); G05B 2219/2602 (2013.01);
Abstract

Provided is a plasma processing apparatus including a processing unit in which a sample is plasma processed and which includes a monitor (optical emission spectroscopy) that monitors light emission of plasma, wherein the processing unit includes a prediction model storage unit that stores a prediction model predicting a plasma processing result, and a control device in which the plasma processing result is predicted by using a prediction model selected based on light emission data and device data as an indicator of state change of the processing unit.


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