The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Jul. 08, 2020
International Business Machines Corporation, Armonk, NY (US);
Flora Gilboa-Solomon, Haifa, IL;
Efrat Hexter, Beit Shemesh, IL;
Dana Levanony, Tel Aviv, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments may include techniques to choose a model based on a similarity of computed features of an input to computed features of several models in order to improve feature analysis using Machine Learning models. A method of image analysis may comprise extracting a training feature vector corresponding to each of the plurality of machine learning models from each validation image from a plurality of machine learning models trained using a plurality of validation images, extracting from a new image a new feature vector corresponding to each of the plurality of machine learning models, comparing each new feature vector corresponding to each machine learning model with the training feature vector corresponding to each of the plurality of machine learning models, and selecting and outputting an inference for the new image generated by the machine learning model for which the new feature vector and the training feature vector are most similar.