The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Feb. 12, 2021
Heidelberger Druckmaschinen Ag, Heidelberg, DE;
Frank Schumann, Heidelberg, DE;
Jan Krieger, Heidelberg, DE;
Bennet Carstensen, Sandhausen, DE;
Peter Eisele, Oestringen, DE;
Heidelberger Druckmaschinen AG, Heidelberg, DE;
Abstract
A method for inspecting printed products of a machine for processing printing substrates includes recording and digitizing produced printed products by using at least one image sensor and analyzing the printed products by using a computer to find potential defects. Defects in the printed products are detected by the computer by comparing the recorded and digitized printed image with a digital reference image, analyzing occurring deviations, and marking defective printed products in a manner suitable for removal. The computer spatially subdivides every digitized printed image into regions with deviations, calculates the time required to analyze every one of the regions, and terminates the analysis of a digitized printed image when the time required to analyze the regions exceeds a predefined value of time per digitized printed image.