The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Oct. 10, 2019
Entigenlogic Llc, Schaumburg, IL (US);
Frank John Williams, Rossmoor, CA (US);
David Ralph Lazzara, Huntington Beach, CA (US);
Donald Joseph Wurzel, Savannah, GA (US);
Paige Kristen Thompson, Huntington Beach, CA (US);
Stephen Emerson Sundberg, Chicago, IL (US);
Ameeta Vasant Reed, Deerfield, IL (US);
Stephen Chen, Wheaton, IL (US);
Dennis Arlen Roberson, Chapin, SC (US);
Thomas James MacTavish, Inverness, IL (US);
Karl Olaf Knutson, Palatine, IL (US);
Jessy Thomas, Palatine, IL (US);
David Michael Corns, II, Elgin, IL (US);
Andrew Chu, St. Charles, IL (US);
Theodore Mazurkiewicz, Lake Zurich, IL (US);
Gary W. Grube, Barrington Hills, IL (US);
entigenlogic LLC, Schaumburg, IL (US);
Abstract
A method includes detecting a defective entigen group within a knowledge database. The defective entigen group includes entigens and one or more entigen relationships between at least some of the entigens. The defective entigen group represents knowledge of a topic. The method further includes obtaining corrective content for the topic based on the defective entigen group and generating a corrective entigen group based on the corrective content. The method further includes updating the defective entigen group utilizing the corrective entigen group to produce a curated entigen group.