The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Feb. 07, 2020
Honeywell International Inc., Morris Plains, NJ (US);
Scott McCloskey, Minneapolis, MN (US);
Keigo Hirakawa, Dayton, OH (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
A system and process to determine whether a digital image has been manipulated involves determining expected locations of non-standard pixels in the digital image, and determining a feature for evaluating the non-standard pixels. The feature in pixels of the digital image that are located at the expected locations of non-standard pixels is then measured, and a statistical measure of the feature of pixels in the digital image that are located at the expected locations of non-standard pixels is evaluated. The digital image is assessed to determine a probability that the digital image includes a manipulated portion, based on the statistical measure. The system and process can also determine a make and model of an image sensing device via an examination of the non-standard pixels.