The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Apr. 25, 2019
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Vijay Chauhan, Burlingame, CA (US);

Banipal Shahbaz, Santa Clara, CA (US);

David Hazekamp, Tinley Park, IL (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/26 (2019.01); G06F 16/22 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 16/26 (2019.01); G06F 16/22 (2019.01); G06F 16/901 (2019.01); G06Q 2220/18 (2013.01);
Abstract

A data intake and query system measures an amount of raw data ingested by the system during defined periods of time. As used herein, ingesting raw data generally refers to receiving the raw data from one or more computing devices and processing the data for storage and searchability. Processing the data may include, for example, parsing the raw data into 'events,' where each event includes a portion of the received data and is associated with a timestamp. Based on a calculated number of events generated by the system during one or more defined time periods, the system may calculate various metrics including, but not limited to, a number of events generated during a particular day, a number of events generated per day over a period of time, a maximum number of events generated in a day over a period of time, an average number of events generated per day, etc.


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