The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Jul. 23, 2019
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Jayant Jain, Cupertino, CA (US);

Russell Lu, Pleasanton, CA (US);

Ly Loi, Los Altos, CA (US);

Rick Lund, Livermore, CA (US);

Arnold Poon, San Mateo, CA (US);

Assignee:

VMWARE, INC., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/22 (2019.01); G06N 20/00 (2019.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 16/2358 (2019.01); G06F 16/2237 (2019.01); G06F 21/55 (2013.01); G06F 2221/034 (2013.01); G06N 20/00 (2019.01);
Abstract

Some embodiments provide a novel method for collecting and reporting attributes of data flows associated with machines executing on a plurality of host computers to an analysis appliance. The analysis appliance, in some embodiments, receives definitions of keys and provides them to the host computers. In some embodiments, existing keys are modified based on the analysis. Additionally, or alternatively, new keys are provided based on the analysis. In some embodiments, the analysis appliance receives the flow group records (e.g., sets of attributes) based on the keys and the configuration data from each host computer.


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