The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Apr. 21, 2020
Applicant:

D-wave Systems Inc., Burnaby, CA;

Inventors:

Andrew J. Berkley, Vancouver, CA;

Ilya V. Perminov, Vancouver, CA;

Mark W. Johnson, Vancouver, CA;

Christopher B. Rich, Vancouver, CA;

Fabio Altomare, North Vancouver, CA;

Trevor M. Lanting, Vancouver, CA;

Assignee:

D-WAVE SYSTEMS INC., Burnaby, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/76 (2006.01); G06F 9/38 (2018.01); G06N 10/00 (2022.01); G06F 16/901 (2019.01); H01L 39/22 (2006.01);
U.S. Cl.
CPC ...
G06F 9/3838 (2013.01); G06F 16/9024 (2019.01); G06N 10/00 (2019.01); H01L 39/223 (2013.01);
Abstract

A hybrid processor includes a classical (digital) processor and a quantum processor and implements a calibration procedure to calibrate devices in the quantum processor. Parameter measurements are defined as vertices in a directed acyclic graph. Dependencies between measurements are defined as directed edges between vertices. The calibration procedure orders the vertices, respecting the order of the dependencies while at least attempting to reduce the time needed to perform all the measurements. The calibration procedure provides a level of abstraction to allow non-expert users to use the calibration procedure. Each vertex has a set of attributes defining the status of the measurement, time of the measurement and value of the measurement.


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