The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Jul. 02, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alexander Sobran, Chapel Hill, NC (US);

Yogesh Rane, Raleigh, NC (US);

Bo Zhang, Cary, NC (US);

Guilherme Ferreira, Raleigh, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/77 (2018.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 8/77 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Approaches presented herein enable domain knowledge-based software defect prediction. More specifically, a cost function configured to train a machine learning model to predict a defect in a software version is obtained. A domain knowledge penalty metric is then determined for a software development team associated with the software version. A linear combination of the determined domain knowledge penalty metric is then applied to the obtained cost function to create a domain knowledge-modified cost function. Using this domain knowledge-modified cost function, the machine learning model is then trained based on a minimization of the domain knowledge-modified cost function. Once trained, the machine learning model is used to report a set of predicted values based on the domain knowledge-modified cost function trained machine learning model.


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