The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

May. 19, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Rongrong Shang, Beijing, CN;

Haiying Tang, Beijing, CN;

Xiaobo Zhang, Beijing, CN;

Jian Gao, Beijing, CN;

Zhilong Wu, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0644 (2013.01); G06F 3/0604 (2013.01); G06F 3/0689 (2013.01);
Abstract

Techniques involve determining a stripe width of an array and metadata of candidate disks available for allocating a new array, the metadata indicating a total slice number in each of the candidate disks and a number of used slices in the candidate disks. The techniques further involve determining, based on the width and the total slice number, a first number of slices in the candidate disks that are available. The techniques further involve determining, based on the number of the used slices, a second slice number in the used slices that are available; and determining, based on the first number and the second number, utilization rates of the candidate disks for the allocation for the new array. Such techniques may make the utilization rates of the candidate disks more accurate, which ensures uniform use of the respective candidate disks and improves the performance of the candidate disks.


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