The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2022
Filed:
Nov. 23, 2019
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Michiie Sakamoto, Tokyo, JP;
Akinori Hashiguchi, Tokyo, JP;
Shinobu Masuda, Tokyo, JP;
Tsuguhide Sakata, Machida, JP;
Masahide Hasegawa, Yokohama, JP;
Osamu Nagatsuka, Kawasaki, JP;
Koichiro Nishikawa, Takasaki, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/26 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01);
Abstract
A microscope system comprises a microscope body, a stage configured to place a slide as an observation target and move in an X direction and a Y direction. The microscope system changes an arrangement of the placed slide with respect to the stage so as to cause a direction indicated by a mark provided on the slide placed on the stage to align with one of the X direction and the Y direction of the stage.